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1

La motivation scolaire : approches récentes et perspectives pratiques || La psychologie de l'enfant. (Que sais-je ? ; 369)by Olivier Houdé

Review by: Fabien Fenouillet

Journal:

Revue française de pédagogie

Year:

2006

Language:

french

File:

PDF, 672 KB

french, 2006

2

Innovative Materials, Devices, and CMOS Technologies for Low-Power Mobile Multimedia

Skotnicki, T., Fenouillet-Beranger, C., Gallon, C., Buf, F., Monfray, S., Payet, F., Pouydebasque, A., Szczap, M., Farcy, A., Arnaud, F., Clerc, S., Sellier, M., Cathignol, A., Schoellkopf, J.-P., Per

Journal:

IEEE Transactions on Electron Devices

Year:

2008

Language:

english

File:

PDF, 5.78 MB

english, 2008

3

Bias-Engineered Mobility in Advanced FD-SOI MOSFETs

Fernandez, Cristina, Rodriguez, Noel, Ohata, Akiko, Gamiz, Francisco, Andrieu, Francois, Fenouillet-Beranger, Claire, Faynot, Olivier, Cristoloveanu, Sorin

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 429 KB

english, 2013

4

La place de la motivation dans la psychologie positive

Fenouillet, Fabien

Journal:

Le Journal des psychologues

Year:

2017

Language:

french

File:

PDF, 2.20 MB

french, 2017

5

Connaissances métacognitives et stratégies d’autorégulation impliquées dans la révision de textes : construction et validation d’un instrument autorapporté

Escorcia, Dyanne, Fenouillet, Fabien

Journal:

Mesure et évaluation en éducation

Year:

2018

Language:

french

File:

PDF, 2.66 MB

french, 2018

6

An investigation of the structure and role of English as a Foreign Language self-efficacy beliefs in the workplace

Chauvin, Rachel, Fenouillet, Fabien, Scott Brewer, Stephen

Journal:

Year:

2020

File:

PDF, 1.13 MB

2020

7

Impact of a 10 nm ultra-thin BOX (UTBOX) and ground plane on FDSOI devices for 32 nm node and below

C. Fenouillet-Beranger, P. Perreau, S. Denorme, L. Tosti, F. Andrieu, O. Weber, S. Monfray, S. Barnola, C. Arvet, Y. Campidelli, S. Haendler, R. Beneyton, C. Perrot, C. de Buttet, P. Gros, L. Pham-Ngu

Journal:

Solid-State Electronics

Year:

2010

Language:

english

File:

PDF, 1.16 MB

english, 2010

8

[IEEE 2009 Proceedings of ESSCIRC (ESSCIRC) - Athens, Greece (2009.09.14-2009.09.18)] 2009 Proceedings of ESSCIRC - Impact of a 10nm Ultra-Thin BOX (UTBOX) and Ground Plane on FDSOI devices for 32nm node and below

Fenouillet-Beranger, C., Perreau, P., Denorme, S., Tosti, L., Andrieu, F., Weber, O., Barnola, S., Arvet, C., Campidelli, Y., Haendler, S., Beneyton, R., Perrot, C., de Buttet, C., Gros, P., Pham-Nguy

Year:

2009

Language:

english

File:

PDF, 1.45 MB

english, 2009

9

La théorie de l’espoir : une revue de questions

Delas, Y., Martin-Krumm, C., Fenouillet, F.

Journal:

Psychologie Française

Year:

2014

Language:

french

File:

PDF, 1.28 MB

french, 2014

10

Validation française de l’échelle multidimensionnelle satisfaction de vie chez l’élève (Multidimensional Students’ Life Satisfaction Scale).

Fenouillet, Fabien, Heutte, Jean, Martin-Krumm, Charles, Boniwell, Ilona

Journal:

Canadian Journal of Behavioural Science/Revue canadienne des sciences du comportement

Year:

2015

Language:

french

File:

PDF, 377 KB

french, 2015

11

Adaptation, Further Elaboration, and Validation of a Scale to Measure Hope as Perceived by People: Discriminant Value and Predictive Utility Vis-à-Vis Dispositional Hope

Krafft, Andreas M., Martin-Krumm, Charles, Fenouillet, Fabien

Journal:

Year:

2017

Language:

english

File:

PDF, 339 KB

english, 2017

12

[IEEE 2017 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2017.12.2-2017.12.6)] 2017 IEEE International Electron Devices Meeting (IEDM) - High performance low temperature FinFET with DSPER, gate last and Self Aligned Contact for 3D sequential mtegration

Micout, J., Lapras, V., Batude, P., Fenouillet-Beranger, C., Lacord, J., Sklenard, B., Mathieu, B., Rafhay, Q., Mazzocchi, V., Colinge, J.-P., Lachal, L., Garros, X., Casse, M., Toffoli, A., Romano, G

Year:

2017

Language:

english

File:

PDF, 573 KB

english, 2017

13

Place attachment influence on human well-being and general pro-environmental behaviors

Junot, Amandine, Paquet, Yvan, Fenouillet, Fabien

Journal:

Journal of Theoretical Social Psychology

Year:

2018

Language:

english

File:

PDF, 845 KB

english, 2018

14

A concrete performance test for delayed ettringite formation: Part I optimisation

Alexandre Pavoine, Loïc Divet, Stéphane Fenouillet

Journal:

Cement and Concrete Research

Year:

2006

Language:

english

File:

PDF, 304 KB

english, 2006

15

A concrete performance test for delayed ettringite formation: Part II validation

Alexandre Pavoine, Loïc Divet, Stéphane Fenouillet

Journal:

Cement and Concrete Research

Year:

2006

Language:

english

File:

PDF, 1.22 MB

english, 2006

16

Process dependence of BTI reliability in advanced HK MG stacks

X. Garros, M. Casse, M. Rafik, C. Fenouillet-Béranger, G. Reimbold, F. Martin, C. Wiemer, F. Boulanger

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 1.59 MB

english, 2009

17

Backscattering coefficient and drift-diffusion mobility extraction in short channel MOS devices

I. Pappas, G. Ghibaudo, C.A. Dimitriadis, C. Fenouillet-Béranger

Journal:

Solid-State Electronics

Year:

2009

Language:

english

File:

PDF, 169 KB

english, 2009

18

FDSOI devices with thin BOX and ground plane integration for 32 nm node and below

C. Fenouillet-Beranger, S. Denorme, P. Perreau, C. Buj, O. Faynot, F. Andrieu, L. Tosti, S. Barnola, T. Salvetat, X. Garros, M. Cassé, F. Allain, N. Loubet, L. Pham-Nguyen, E. Deloffre, M. Gros-Jean,

Journal:

Solid-State Electronics

Year:

2009

Language:

english

File:

PDF, 789 KB

english, 2009

19

Mobility enhancement by CESL strain in short-channel ultrathin SOI MOSFETs

L. Pham-Nguyen, C. Fenouillet-Beranger, G. Ghibaudo, T. Skotnicki, S. Cristoloveanu

Journal:

Solid-State Electronics

Year:

2010

Language:

english

File:

PDF, 734 KB

english, 2010

20

A comparison of advanced transport models for the computation of the drain current in nanoscale nMOSFETs

P. Palestri, C. Alexander, A. Asenov, V. Aubry-Fortuna, G. Baccarani, A. Bournel, M. Braccioli, B. Cheng, P. Dollfus, A. Esposito, D. Esseni, C. Fenouillet-Beranger, C. Fiegna, G. Fiori, A. Ghetti, G.

Journal:

Solid-State Electronics

Year:

2009

Language:

english

File:

PDF, 1.23 MB

english, 2009

21

Characterization and modeling of capacitances in FD-SOI devices

Imed Ben Akkez, Antoine Cros, Claire Fenouillet-Beranger, P. Perreau, A. Margain, Frederic Boeuf, Francis Balestra, Gérard Ghibaudo

Journal:

Solid-State Electronics

Year:

2012

Language:

english

File:

PDF, 1.05 MB

english, 2012

22

Multi- UTBB FDSOI Device Architectures for Low-Power CMOS Circuit

Noel, J.-P., Thomas, O., Jaud, M., Weber, O., Poiroux, T., Fenouillet-Beranger, C., Rivallin, P., Scheiblin, P., Andrieu, F., Vinet, M., Rozeau, O., Boeuf, F., Faynot, O., Amara, A.

Journal:

IEEE Transactions on Electron Devices

Year:

2011

Language:

english

File:

PDF, 1.25 MB

english, 2011

23

Effect of goal setting on the strategies used to solve a block design task

Paulette Rozencwajg, Fabien Fenouillet

Journal:

Learning and Individual Differences

Year:

2012

Language:

english

File:

PDF, 752 KB

english, 2012

24

Parasitic bipolar impact in 32 nm undoped channel Ultra-Thin BOX (UTBOX) and biased Ground Plane FDSOI high-k/metal gate technology

C. Fenouillet-Beranger, P. Perreau, P. Boulenc, L. Tosti, S. Barnola, F. Andrieu, O. Weber, R. Beneyton, C. Perrot, C. de Buttet, F. Abbate, Y. Campidelli, L. Pinzelli, P. Gouraud, A. Margain, S. Peru

Journal:

Solid-State Electronics

Year:

2012

Language:

english

File:

PDF, 2.68 MB

english, 2012

25

[IEEE 2010 IEEE International SOI Conference - San Diego, CA, USA (2010.10.11-2010.10.14)] 2010 IEEE International SOI Conference (SOI) - High performance and low variability fully-depleted strained-SOI MOSFETs

Mazurier, J., Weber, O., Andrieu, F., Allain, F., Tabone, C., Toffoli, A., Fenouillet-Beranger, C., Brevard, L., Tosti, L., Perreau, P., Belleville, M., Faynot, O.

Year:

2010

Language:

english

File:

PDF, 667 KB

english, 2010

26

[IEEE 2010 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2010.12.6-2010.12.8)] 2010 International Electron Devices Meeting - Planar Fully depleted SOI technology: A powerful architecture for the 20nm node and beyond

Faynot, O., Andrieu, F., Weber, O., Fenouillet-Beranger, C., Perreau, P., Mazurier, J., Benoist, T., Rozeau, O., Poiroux, T., Vinet, M., Grenouillet, L., Noel, J-P., Posseme, N., Barnola, S., Martin,

Year:

2010

Language:

english

File:

PDF, 655 KB

english, 2010

27

Plasma wave detection of terahertz radiation by silicon field effects transistors: Responsivity and noise equivalent power

Tauk, R., Teppe, F., Boubanga, S., Coquillat, D., Knap, W., Meziani, Y. M., Gallon, C., Boeuf, F., Skotnicki, T., Fenouillet-Beranger, C., Maude, D. K., Rumyantsev, S., Shur, M. S.

Journal:

Applied Physics Letters

Year:

2006

Language:

english

File:

PDF, 612 KB

english, 2006

28

Mononuclear cell adenosine deaminase and CD26/dipeptidylpeptidase-IV activities are sensitive markers of reperfusion during percutaneous transluminal angioplasty

Moro, Pierre-Julien, Quilici, Jacques, Giorgi, Roch, Cuisset, Thomas, By, Youlet, Boussuges, Alain, Jammes, Yves, Bonnet, Jean-Louis, Ruf, Jean, Fenouillet, Emmanuel, Guieu, Régis

Journal:

International Journal of Cardiology

Year:

2013

Language:

english

File:

PDF, 404 KB

english, 2013

29

[IEEE 2008 IEEE International SOI Conference - New Paltz, NY (2008.10.6-2008.10.9)] 2008 IEEE International SOI Conference - Direct comparison of Si/High-K and Si/SiO2 channels in advanced FD SOI MOSFETs

Pham-Nguyen, L., Fenouillet-Beranger, C., Vandooren, A., Wild, A., Ghibaudo, G., Cristoloveanu, S.

Year:

2008

Language:

english

File:

PDF, 173 KB

english, 2008

30

Study of substrate orientations impact on Ultra Thin Buried Oxide (UTBOX) FDSOI High-K Metal gate technology performances

Ben Akkez, Imed, Fenouillet-Beranger, Claire, Cros, Antoine, Perreau, Pierre, Haendler, Sébatien, Weber, Olivier, Andrieu, François, Pellissier-Tanon, D., Abbate, F., Richard, C., Beneyton, R., Gourau

Journal:

Solid-State Electronics

Year:

2013

Language:

english

File:

PDF, 1.71 MB

english, 2013

31

Impact of local back biasing on performance in hybrid FDSOI/bulk high-k/metal gate low power (LP) technology

Fenouillet-Beranger, C., Perreau, P., Benoist, T., Richier, C., Haendler, S., Pradelle, J., Bustos, J., Brun, P., Tosti, L., Weber, O., Andrieu, F., Orlando, B., Pellissier-Tanon, D., Abbate, F., Rich

Journal:

Solid-State Electronics

Year:

2013

Language:

english

File:

PDF, 3.02 MB

english, 2013

32

New parameter extraction method based on split C–V measurements in FDSOI MOSFETs

Ben Akkez, Imed, Cros, Antoine, Fenouillet-Beranger, Claire, Boeuf, Frederic, Rafhay, Q., Balestra, Francis, Ghibaudo, Gérard

Journal:

Solid-State Electronics

Year:

2013

Language:

english

File:

PDF, 502 KB

english, 2013

33

[IEEE 2007 IEEE International Electron Devices Meeting - Washington, DC, USA (2007.12.10-2007.12.12)] 2007 IEEE International Electron Devices Meeting - Strained FDSOI CMOS technology scalability down to 2.5nm film thickness and 18nm gate length with a TiN/HfO2 gate stack

Barral, V., Poiroux, T., Andrieu, F., Buj-Dufournet, C., Faynot, O., Ernst, T., Brevard, L., Fenouillet-Beranger, C., Lafond, D., Hartmann, J.M., Vidal, V., Allain, F., Daval, N., Cayrefourcq, I., Tos

Year:

2007

Language:

english

File:

PDF, 4.44 MB

english, 2007

34

[IEEE 2011 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2011.12.5-2011.12.7)] 2011 International Electron Devices Meeting - Low frequency noise variability in high-k/metal gate stack 28nm bulk and FD-SOI CMOS transistors

Ioannidis, E. G., Haendler, S., Bajolet, A., Pahron, T., Planes, N., Arnaud, F., Bianchi, R.A., Haond, M., Golanski, D., Rosa, J., Fenouillet-Beranger, C., Perreau, P., Dimitriadis, C.A., Ghibaudo, G.

Year:

2011

Language:

english

File:

PDF, 2.50 MB

english, 2011

35

[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - High immunity to threshold voltage variability in undoped ultra-thin FDSOI MOSFETs and its physical understanding

Weber, O., Faynot, O., Andrieu, F., Buj-Dufournet, C., Allain, F., Scheiblin, P., Foucher, J., Daval, N., Lafond, D., Tosti, L., Brevard, L., Rozeau, O., Fenouillet-Beranger, C., Marin, M., Boeuf, F.,

Year:

2008

Language:

english

File:

PDF, 571 KB

english, 2008

36

[IEEE ESSDERC 2010 - 40th European Solid State Device Research Conference - Sevilla, Spain (2010.09.14-2010.09.16)] 2010 Proceedings of the European Solid State Device Research Conference - UT2B-FDSOI device architecture dedicated to low power design techniques

Noel, J.-P., Thomas, O., Jaud, M.-A., Fenouillet-Beranger, C., Rivallin, P., Scheiblin, P., Poiroux, T., Boeuf, F., Andrieu, F., Weber, O., Faynot, O., Amara, A.

Year:

2010

Language:

english

File:

PDF, 483 KB

english, 2010

37

[IEEE 2010 IEEE International SOI Conference - San Diego, CA, USA (2010.10.11-2010.10.14)] 2010 IEEE International SOI Conference (SOI) - ESD robustness of FDSOI gated diode for ESD network design: Thin or thick BOX?

Benoist, Thomas, Fenouillet-Beranger, Claire, Perreau, Pierre, Buj, Christel, Galy, Philippe, Marin-Cudraz, David, Faynot, Olivier, Cristoloveanu, Sorin, Gentil, Pierre

Year:

2010

Language:

english

File:

PDF, 610 KB

english, 2010

38

[IEEE 2010 IEEE International Symposium on Circuits and Systems - ISCAS 2010 - Paris, France (2010.05.30-2010.06.2)] Proceedings of 2010 IEEE International Symposium on Circuits and Systems - 32nm and beyond Multi-VT Ultra-Thin Body and BOX FDSOI: From device to circuit

Thomas, O., Noel, J.-P., Fenouillet-Beranger, C., Jaud, M.-A., Dura, J., Perreau, P., Boeuf, F., Andrieu, F., Delprat, D., Boedt, F., Bourdelle, K., Nguyen, B.-Y., Vladimirescu, A., Amara, A.

Year:

2010

Language:

english

File:

PDF, 857 KB

english, 2010

39

Influence of school environment on adolescents' creative potential, motivation and well-being

Besançon, Maud, Fenouillet, Fabien, Shankland, Rebecca

Journal:

Learning and Individual Differences

Year:

2015

Language:

english

File:

PDF, 477 KB

english, 2015

40

Motivation, rébellion, fuite et injustice à l’école

Lieury, A., Lorant, S., Vrignaud, P., Fenouillet, F.

Journal:

Psychologie Française

Year:

2015

File:

PDF, 1.17 MB

2015

41

[IEEE 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Reno, NV, USA (2015.9.27-2015.10.2)] 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Innovative high-density ESD protection device in state of the art UTBB FDSOI technologies

Fonteneau, Pascal, Solaro, Yohann, Marin-Cudraz, David, Legrand, Charles-Alexandre, Fenouillet-Beranger, Claire

Year:

2015

Language:

english

File:

PDF, 746 KB

english, 2015

42

[IEEE 2016 16th International Workshop on Junction Technology (IWJT) - Shanghai (2016.5.9-2016.5.10)] 2016 16th International Workshop on Junction Technology (IWJT) - Dopant activation and crystal recovery in arsenic-implanted ultra-thin silicon-on-insulator structures using 308nm nanosecond laser annealing

Kerdiles, S., Alba, P. Acosta, Mathieu, B., Veillerot, M., Kachtouli, R., Besson, P., Denis, H., Mazzamuto, F., Toque-Tresonne, I., Huet, K., Fenouillet-Beranger, C.

Year:

2016

Language:

english

File:

PDF, 14.76 MB

english, 2016

43

Validation of the Warwick-Edinburgh Mental Well-Being Scale (WEMWBS) in French psychiatric and general populations

Trousselard, Marion, Steiler, Dominique, Dutheil, Frédéric, Claverie, Damien, Canini, Frédéric, Fenouillet, Fabien, Naughton, Geraldine, Stewart-Brown, Sarah, Franck, Nicolas

Journal:

Psychiatry Research

Year:

2016

Language:

english

File:

PDF, 666 KB

english, 2016

44

ERICA– an instrument to measure individual and collective regulation of learning

Kaplan, J., de Montalembert, M., Laurent, P., Fenouillet, F.

Journal:

Revue Européenne de Psychologie Appliquée/European Review of Applied Psychology

Year:

2017

File:

PDF, 761 KB

2017

45

Changes in Emotions from Childhood to Young Adulthood

Martin-Krumm, C., Fenouillet, F., Csillik, A., Kern, L., Besancon, M., Heutte, J., Paquet, Y., Delas, Y., Trousselard, M., Lecorre, B., Diener, E.

Journal:

Child Indicators Research

Year:

2017

Language:

english

File:

PDF, 561 KB

english, 2017

46

[IEEE 2018 IEEE International Symposium on Circuits and Systems (ISCAS) - Florence, Italy (2018.5.27-2018.5.30)] 2018 IEEE International Symposium on Circuits and Systems (ISCAS) - Role of synaptic variability in spike-based neuromorphic circuits with unsupervised learning

Ly, D. R. B., Grossi, A., Werner, T., Dalgaty, T., Fenouillet-Beranger, C., Vianello, E., Nowak, E.

Year:

2018

Language:

english

File:

PDF, 814 KB

english, 2018

47

[IEEE 2018 International Conference on IC Design & Technology (ICICDT) - Otranto, Italy (2018.6.4-2018.6.6)] 2018 International Conference on IC Design & Technology (ICICDT) - A review on opportunities brought by 3D-monolithic integration for CMOS device and digital circuit

Andrieu, F., Batude, P., Brunet, L., Fenouillet-Beranger, C., Lattard, D., Thuries, S., Billoint, O., Fournel, R., Vinet, M.

Year:

2018

Language:

english

File:

PDF, 1.15 MB

english, 2018

48

La place de la motivation dans la psychologie positive

Fenouillet, Fabien

Journal:

Le Journal des psychologues

Year:

2017

File:

PDF, 2.20 MB

2017

49

Role of synaptic variability in resistive memory-based spiking neural networks with unsupervised learning

Ly, Denys Riwan Bunsothy, Grossi, Alessandro, Fenouillet-Beranger, Claire, Nowak, Etienne, Querlioz, Damien, Vianello, Elisa

Journal:

Journal of Physics D Applied Physics

Year:

2018

Language:

english

File:

PDF, 1.38 MB

english, 2018

50

Relation entre l’intérêt et le bien-être au collège et au lycée

Fenouillet, Fabien, Chainon, David, Yennek, Nora, Masson, Julien, Heutte, Jean

Journal:

Year:

2017

Language:

french

File:

PDF, 882 KB

french, 2017

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